Share Email Print
cover

Proceedings Paper

Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A phase reversal speckle interferometric (PRSI) system is developed for precise measurement of in-plane displacement component of a deformation vector with twofold measuring sensitivity. In the system, the phase reversal is accomplished by varying the pressure within an air field quartz cell inserted in one of the observation arms of a dual beam symmetric illumination-observation arrangement. The work reported here is classified into two parts: the first part illustrates a novel real-time phase reversal speckle photography technique for exact π-phase shift calibration using a two wave coupling arrangement in a BaTiO3 photorefractive crystal as a recording medium. The second part consists of simultaneously providing object deformation and an exact phase shift of π between the exposures using PRSI system to achieve twofold measuring sensitivity.

Paper Details

Date Published: 4 October 2001
PDF: 9 pages
Proc. SPIE 4564, Optomechatronic Systems II, (4 October 2001); doi: 10.1117/12.444108
Show Author Affiliations
Nandigana K. Krishna Mohan, Indian Institute of Technology Madras (India)


Published in SPIE Proceedings Vol. 4564:
Optomechatronic Systems II
Hyungsuck Cho, Editor(s)

© SPIE. Terms of Use
Back to Top