Proceedings PaperVery small portable holographic interferometers and compact speckle interferometer with semiconductor laser sources well suited for industrial inspections
|Format||Member Price||Non-Member Price|
|GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free.||Check Access|
Current manufacturing processes require rapid, reliable methods and compact, user-friendly, elegant devices capable to work even in unpromising environment. Innovative user- friendly methods and techniques as well as small holographic and speckle interferometers are presented in this paper. The devices are very compact, easy to operate, incorporate semiconductor laser sources and do not require personnel skilled in optics. Miniature semiconductor laser sources were successfully used in holography and laser speckle metrology for the tasks of 3-dimensional data acquisition, storage and display. Semiconductor lasers enable compact recording and display devices which are easy in operation and well fitted to practical industrial environments. Novel inspection methods and compact devices incorporating miniature semiconductor laser sources can be applied for automated inspections and optical precision measurements in optomechatronic systems. They fit well for real time monitoring of local deformations. Presented devices and techniques meet modern industrial requirements and permit to work in unpromising environment, perform in situ checks of products and components. Vast experimental data are given and the possibilities of innovative devices and techniques are properly illustrated in multiple practical examples. Photographs from holograms and holographic interferograms recorded with semiconductor lasers and successive sets of snapshots during real time monitoring of thermal fields are presented.