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Proceedings Paper

Converting non-interlaced to interlaced images in YIQ and HSI color spaces
Author(s): Eric B. Welch; Robert J. Moorhead II; John K. Owens
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Paper Abstract

Directly converting images from the noninterlaced format used by high resolution monitors to the interlaced NTSC standard can result in several artifacts which are visually disturbing. One of the most noticeable of these is a flickering effect visible on sharp horizontal edges which is due to the interlace of the NTSC video signal. This flickering effect can be significantly reduced using an appropriately designed spatial filter to remove abrupt horizontal changes in the image without excessive blurring of the image. Due to the availability of application specific integrated circuits which convert images between different color spaces, it is practical to filter in any of several color spaces. Therefore, our current research focuses on comparing tradition interfield spatial filtering in the YIQ color space to new spatial filtering techniques developed by the authors using the HSI color space. Results based on an extended version of the CCIR impairment scale are presented. The present experiments are based on renderings of computation grids obtained from the NFS/MSU Engineering Research Center of computational Field Simulation. The paper also demonstrates how a red fringe occurs in wire grid images with gray scale backgrounds when these images are spatially filtered in the HSI color space. Further, a means of correcting this red shift is demonstrated.

Paper Details

Date Published: 1 June 1991
PDF: 9 pages
Proc. SPIE 1453, Human Vision, Visual Processing, and Digital Display II, (1 June 1991); doi: 10.1117/12.44359
Show Author Affiliations
Eric B. Welch, Mississippi State Univ. (United States)
Robert J. Moorhead II, Mississippi State Univ. (United States)
John K. Owens, Mississippi State Univ. (United States)

Published in SPIE Proceedings Vol. 1453:
Human Vision, Visual Processing, and Digital Display II
Bernice E. Rogowitz; Michael H. Brill; Jan P. Allebach, Editor(s)

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