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Proceedings Paper

Holographic rapid access system for onboard testing of MEMS in microgravity
Author(s): Valery Petrov
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Paper Abstract

Review of current and emerging methods of holography and speckle metrology is given. Onboard research by means of holography and speckle metrology is analyzed. Advanced holographic rapid access system (RAS) is presented. It is very simple, compact, portable, user-friendly and requires minimal hardware. Holographic RAS has several modifications and spin-offs. Ultra high resolution silver halide media are used in this RAS.

Paper Details

Date Published: 2 October 2001
PDF: 12 pages
Proc. SPIE 4558, Reliability, Testing, and Characterization of MEMS/MOEMS, (2 October 2001); doi: 10.1117/12.443017
Show Author Affiliations
Valery Petrov, FIBA (Germany)


Published in SPIE Proceedings Vol. 4558:
Reliability, Testing, and Characterization of MEMS/MOEMS
Rajeshuni Ramesham, Editor(s)

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