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Proceedings Paper

Pulsed photothermal spectroscopy applied to lanthanide and actinide speciation
Author(s): John M. Berg; David E. Morris; David A. Clark; C. D. Tait; William H. Woodruff; William G. Van Der Sluys
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Paper Abstract

The Water Window Imaging X-Ray Microscope is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-Ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-Ray Microscope Program demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On Hemlite grade Sapphire, the authors have achieved microscope mirror substrates on concave and convex spherical surfaces with 0.5 A rms surface smoothness, as measured by the Zygo profilometer. In this paper the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-Ray Microscope is reported.

Paper Details

Date Published: 1 July 1991
PDF: 7 pages
Proc. SPIE 1435, Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications, (1 July 1991); doi: 10.1117/12.44256
Show Author Affiliations
John M. Berg, Los Alamos National Lab. (United States)
David E. Morris, Los Alamos National Lab. (United States)
David A. Clark, Los Alamos National Lab. (United States)
C. D. Tait, Los Alamos National Lab. (United States)
William H. Woodruff, Los Alamos National Lab. (United States)
William G. Van Der Sluys, Univ. of Montana (United States)


Published in SPIE Proceedings Vol. 1435:
Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications
Bryan L. Fearey, Editor(s)

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