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Proceedings Paper

Two-dimensional optical measurement techniques based on optic birefringence effects
Author(s): Yongchang Zhu; Tatsuo Takada; Yoshihiro Murooka
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Paper Abstract

Some dielectric materials may become birefringent when subjected to an external force, such as an electric field or a mechanical force. For more than a decade, our research group has been engaged in developing 2D optical measurement techniques for the dynamic measurement of charge distributions on a dielectric surface using the electro- optic Pockels effect, the dynamic measurement of electrical field distributions in a liquid using the electro-optic Kerr effect and the measurement of birefringence vector distributions in plastic plates using the photo-elastic effect. The common image processing techniques that are uniquely developed in our work are analyzed and summarized.

Paper Details

Date Published: 18 September 2001
PDF: 11 pages
Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); doi: 10.1117/12.440281
Show Author Affiliations
Yongchang Zhu, Sankosha Corp. (Japan)
Tatsuo Takada, Musashi Institute of Technology (Japan)
Yoshihiro Murooka, Musashi Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 4556:
Data Mining and Applications
Deren Li; Jie Yang; Jufu Feng; Shen Wei, Editor(s)

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