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Proceedings Paper

Linearization of Pt resistance temperature measurement circuit
Author(s): Chuan-xiang Li
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Paper Abstract

A correction method for non-linear Pt resistance temperature measurement based on the principle of A/D conversion is introduced. The design principle of Pt resistance linear temperature measurement is analyzed and a new method for interfacing A/D converter with single chip computer 89c52 is provided together with the experimental data.

Paper Details

Date Published: 14 September 2001
PDF: 4 pages
Proc. SPIE 4414, International Conference on Sensor Technology (ISTC 2001), (14 September 2001); doi: 10.1117/12.440221
Show Author Affiliations
Chuan-xiang Li, Huazhong Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 4414:
International Conference on Sensor Technology (ISTC 2001)
Yikai Zhou; Shunqing Xu, Editor(s)

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