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Proceedings Paper

Spatial phase-stepping using a computer-generated diffractive optical element
Author(s): Ramon Rodriguez-Vera; Bernardino Barrientos; Andrew John Moore
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Paper Abstract

A computer-generated diffractive optical element (DOE) is used in electronic speckle pattern interferometry (ESPI). This DOE is applied to calculate the interference phase corresponding to object deformation from a single TV frame. The system is utilized for static and transient deformation measurement with CW and pulse Nd:YAG lasers, respectively. The DOE is a modified phase computer generated hologram or cross grating. For transient deformation measurements the DOE does not need to be translated in order to introduce the phase change between diffracted fields. Thus, spatial phase- stepping becomes feasible and high-speed frame acquisitions do not limit real-time phase measurements. Experimental results for spatial phase-stepping with and without moving the DOE are given.

Paper Details

Date Published: 11 September 2001
PDF: 12 pages
Proc. SPIE 4420, Laser Metrology for Precision Measurement and Inspection in Industry, (11 September 2001); doi: 10.1117/12.439207
Show Author Affiliations
Ramon Rodriguez-Vera, Ctr. de Investigaciones en Optica A.C. (Mexico)
Bernardino Barrientos, Ctr. de Investigaciones en Optica A.C. (United Kingdom)
Andrew John Moore, Heriot-Watt Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 4420:
Laser Metrology for Precision Measurement and Inspection in Industry

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