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Proceedings Paper

Sources of error in absolute distance interferometry
Author(s): Jack A. Stone; A. Stejskal; Lowell P. Howard
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Paper Abstract

In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primarily employed a 670 nm external cavity diode laser as the tunable source for our interferometer, but currently, we are developing a system based on an 850 nm distributed Bragg reflector laser. These two laser have very different strengths and weaknesses; the primary sources of uncertainty in length measurement depend on which laser is employed.

Paper Details

Date Published: 11 September 2001
PDF: 9 pages
Proc. SPIE 4420, Laser Metrology for Precision Measurement and Inspection in Industry, (11 September 2001); doi: 10.1117/12.439197
Show Author Affiliations
Jack A. Stone, National Institute of Standards and Technology (United States)
A. Stejskal, Institute of Scientific Instruments (Czech Republic)
Lowell P. Howard, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 4420:
Laser Metrology for Precision Measurement and Inspection in Industry

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