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Proceedings Paper

Measurement of the infrared refractive index of sapphire as a function of temperature
Author(s): Di Yang; Michael E. Thomas; Simon G. Kaplan
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Paper Abstract

A complete and independent method is used to measure the infrared refractive index of sapphire, both e-ray and o-ray, as a function of temperature and frequency. The technique combines single frequency and broadband measurements. The refractive index at the wavelength 3.39micrometers is measured using a prism and the minimum deviation method. A laser interferometer and an etalon of the material are then used to measure the thermo-optic coefficient also at 3.39micrometers . A broadband FTIR spectrometer is used to measure the transmittance spectrum of the etalon and then a fringe counting method is applied to obtain the frequency dependent refractive index. The technique is applied to sapphire over the temperature range from room temperature to 600 degree(s)C and wavelength range from 1 to 5micrometers . High accuracy is demonstrated. The errors of this experimental approach are analyzed.

Paper Details

Date Published: 7 September 2001
PDF: 11 pages
Proc. SPIE 4375, Window and Dome Technologies and Materials VII, (7 September 2001); doi: 10.1117/12.439193
Show Author Affiliations
Di Yang, The Johns Hopkins Univ. (United States)
Michael E. Thomas, The Johns Hopkins Univ. (United States)
Simon G. Kaplan, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 4375:
Window and Dome Technologies and Materials VII
Randal W. Tustison, Editor(s)

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