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Proceedings Paper

Characterization/test software for high-density IR focal planes
Author(s): Charles F. Walmsley; Timothy R. Beystrum; Charles Glasser; Ray Himoto; Mark K. Preis; Dave Parkinson; Marcus L. Sutton
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Paper Abstract

This paper describes test software developed for both the 480 X 12 X 4 and 256 X 256 InSb focal planes manufactured at Litton EOS, Tempe, AZ. The software controls flux sources, frame grabbers and control electronics to provide a fully automated test environment. As well as providing focal plane screening and characterization, the software is an essential diagnostic tool, whereby critical performance attributes such as R0A, quantum efficiency and noise may be displayed both in histogram form and as spatial color-coded bitmap images. These bitmap images may be scanned using the mouse, so that the performance attributes of each pixel may be directly accessed. The software incorporates an emulation mode, in which the array performance is modeled in complete detail (including parameter spreads), with the data presented in identical format to that from the measured data. This allows theoretical performance to be compared directly with measured performance. The software also has the capability to perform bad pixel identification and substitution--a variety of algorithms are available--as well as detector gain/offset correction coefficients calculation.

Paper Details

Date Published: 10 September 2001
PDF: 9 pages
Proc. SPIE 4372, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII, (10 September 2001); doi: 10.1117/12.439157
Show Author Affiliations
Charles F. Walmsley, Walmsley (Microelectronics) Ltd. (United Kingdom)
Timothy R. Beystrum, Litton Electro-Optical Systems (United States)
Charles Glasser, Litton Electro-Optical Systems (United States)
Ray Himoto, Litton Electro-Optical Systems (United States)
Mark K. Preis, Litton Electro-Optical Systems (United States)
Dave Parkinson, Litton Electro-Optical Systems (United States)
Marcus L. Sutton, Litton Electro-Optical Systems (United States)

Published in SPIE Proceedings Vol. 4372:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII
Gerald C. Holst, Editor(s)

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