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Proceedings Paper

High-resolution spectral characterization of high-power laser diodes
Author(s): Friedhelm Dorsch
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Paper Abstract

The combination of a scanning monochromator, a digitizing oscilloscope and a computer, allows time-resolved spectral measurements on laser diodes. The flexible system described covers a wide range of timescale, well below 1 microsecond(s) ec at a spectral resolution of down to 0.05 nm. With this system the authors have investigated quasi-cw laser diode bars that are designed for solid-state laser pumping, at various operating conditions. The time evolution of the center wavelength is quite well fitted by a square root function according to non-stationary thermodynamics. The measuring system enables judgement of the quality of mounting technique and helps in choosing the right heatsink to minimize the wavelength chirp during a light pulse.

Paper Details

Date Published: 1 July 1991
PDF: 10 pages
Proc. SPIE 1418, Laser Diode Technology and Applications III, (1 July 1991); doi: 10.1117/12.43833
Show Author Affiliations
Friedhelm Dorsch, Heimann GmbH (Germany)


Published in SPIE Proceedings Vol. 1418:
Laser Diode Technology and Applications III
Daniel S. Renner, Editor(s)

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