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Proceedings Paper

HILS testing: the use of a PC for real-time IR reticle simulation
Author(s): Matthys J.U. du Plooy; Francois G. Collin
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Paper Abstract

Hardware in the loop simulation (HILS) is used in the evaluation of various IR seeker systems. To perform IR HILS testing a number of costly peripheral systems are required. The most important of these are the motion simulation table, the IR scene generator, the IR scene projector, the dynamics simulator and the simulation controller. The cost of IR image projectors prohibits a number of scientists with access to the remaining equipment from preforming HILS testing of IR seekers. Simulating the reticle and calculating the detector signal in real-time allows the evaluator to bypass the IR scene projector and to do signal injection into the unit under test (UUT). The use of a commercial off the shelf personal computer permits the testing of single detector reticle seekers at a fraction of the cost of an IR image projector. This paper will deal with the development of the algorithms required to realize a real-time simulation of a conical scan FM reticle. The simulation makes use of image processing techniques which are computationally intensive. This paper will investigate methods to decrease the simulation time in order to generate real-time signals for the UUT. The implementation of the various techniques as well as the effect on the simulation time will be presented. The disadvantages and problems associated with these methods will also be explored. The algorithms that were developed will be presented along with the fastest simulation times achieved.

Paper Details

Date Published: 31 August 2001
PDF: 8 pages
Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438091
Show Author Affiliations
Matthys J.U. du Plooy, CSIR (South Africa)
Francois G. Collin, CSIR (South Africa)


Published in SPIE Proceedings Vol. 4366:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
Robert Lee Murrer, Editor(s)

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