
Proceedings Paper
Current status of IR scene projection at the U.S. Army Aviation and Missile CommandFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper describes the recent addition, characterization, and integration of emerging technologies for dynamic infrared scene projection at the US Army Aviation and Missile Command's Advanced Simulation Center. Infrared scene projection performs a vital role in the daily testing of tactical and theater missile systems within these Hardware- in-the-Loop (HWIL) laboratories. Topics covered within this paper include the addition and characterizations of new Honeywell and Santa Barbara Infrared emitter arrays, the integration and operation of the Honeywell and SBIR emitter array systems into a HWIL test, the development of high speed reduced-size IRSP drive electronics, the development of a NUC/characterization station, added software support, and the status of DMD-based infrared scene projector. Example imagery and test results from several of the projector systems are included within this paper.
Paper Details
Date Published: 31 August 2001
PDF: 11 pages
Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438066
Published in SPIE Proceedings Vol. 4366:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
Robert Lee Murrer, Editor(s)
PDF: 11 pages
Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438066
Show Author Affiliations
Daniel A. Saylor, Optical Sciences Corp. (United States)
D. Brett Beasley, Optical Sciences Corp. (United States)
D. Brett Beasley, Optical Sciences Corp. (United States)
Bill Braselton, Boeing Co. (United States)
James A. Buford, U.S. Army Aviation and Missile Command (United States)
James A. Buford, U.S. Army Aviation and Missile Command (United States)
Published in SPIE Proceedings Vol. 4366:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
Robert Lee Murrer, Editor(s)
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