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Proceedings Paper

Flight test results of a synthetic-vision elevation database integrity monitor
Author(s): Maarten Uijt de Haag; Jonathon Sayre; Jacob Campbell; Steve D. Young; Robert Anthony Gray
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Paper Abstract

This paper discusses the flight test results of a real-time Digital Elevation Model (DEM) integrity monitor for Civil Aviation applications. Providing pilots with Synthetic Vision displays containing terrain information has the potential to improve flight safety by improving situational awareness and thereby reducing the likelihood of Controlled Flight Into Terrain. Utilization of DEMs, such as the digital terrain elevation data, requires a DEM integrity check and timely integrity alerts to the pilots when used for flight-critical terrain-displays, otherwise the DEM may provide hazardous misleading terrain information. The discussed integrity monitor checks the consistency between a terrain elevation profile synthesized from sensor information, and the profile given in the DEM. The synthesized profile is derived from DGPS and radar altimeter measurements. DEMs of various spatial resolutions are used to illustrate the dependency of the integrity monitor's performance on the DEMs spatial resolution. The paper will give a description of proposed integrity algorithms, the flight test setup, and the results of a flight test performed at the Ohio University airport and in the vicinity of Asheville, NC.

Paper Details

Date Published: 28 August 2001
PDF: 10 pages
Proc. SPIE 4363, Enhanced and Synthetic Vision 2001, (28 August 2001); doi: 10.1117/12.438016
Show Author Affiliations
Maarten Uijt de Haag, Ohio Univ. (United States)
Jonathon Sayre, Ohio Univ. (United States)
Jacob Campbell, Ohio Univ. (United States)
Steve D. Young, NASA Langley Research Ctr. (United States)
Robert Anthony Gray, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 4363:
Enhanced and Synthetic Vision 2001
Jacques G. Verly, Editor(s)

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