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Proceedings Paper

Life test of high-power Matsushita BTRS laser diodes
Author(s): Terry L. Holcomb
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Paper Abstract

Results of a 15,000-hr life test of Matsushita BTRS lasers operating at 70-mW peak output power under 50 percent duty cycle pulse modulations are presented. Twenty-two lasers were tested in three temperature groups to provide accelerated aging. Evidence of two different failure mechanisms affecting the lasers was found. Devices tested at 20 C exhibited an unexpectedly high failure rate compared to devices tested at 40 and 70 C, but still had a median lifetime in this test of 11,900 hr. All failed devices from the 20-C group showed facet damage, while no facet damage was seen on failed devices from the other two temperature groups. A median lifetime of 85,000 hr at a 20-C operating temperature is predicted.

Paper Details

Date Published: 1 June 1991
PDF: 10 pages
Proc. SPIE 1417, Free-Space Laser Communication Technologies III, (1 June 1991); doi: 10.1117/12.43787
Show Author Affiliations
Terry L. Holcomb, TRW Advanced Research Technology Div. (United States)

Published in SPIE Proceedings Vol. 1417:
Free-Space Laser Communication Technologies III
David L. Begley; Bernard D. Seery, Editor(s)

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