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Proceedings Paper

Nanometer-scale metrology: meeting the nanotechnology measurement challenges
Author(s): Michael T. Postek
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Paper Abstract

NIST is responsible to U.S. industry for developing length intensive measurement capabilities and calibration standards in the nanometer scale regime. The Nanometer-Scale Metrology Program is an integrated Manufacturing Engineering Laboratory program composed of projects all aimed at accurate nano-length metrology. These projects range (in part) from scanning probe microscopies, optical microscopy, interferometry, scanning electron microscopy, and include traditional linescale interferometry which maintains the NIST capability for length scale measurements at a World-class level. The industrial relevancy of the research and standards provided by this program has resulted in a large number of industrial interactions.

Paper Details

Date Published: 24 July 2002
PDF: 10 pages
Proc. SPIE 4608, Nanostructure Science, Metrology, and Technology, (24 July 2002); doi: 10.1117/12.437742
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Published in SPIE Proceedings Vol. 4608:
Nanostructure Science, Metrology, and Technology

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