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Proceedings Paper

Comparative life test of 0.8-um laser diodes for SILEX under NRZ and QPPM modulation
Author(s): Bodo Menke; Roland Loeffler
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Paper Abstract

The procedures and preliminary results of accelerated life tests performed within the framework of an evaluation program under the ESA contract are described. In order to calculate the activation energy and median lifetime and to investigate the drift behavior of optical parameters, a conventional three-temperature aging test at 30, 50, and 70 C is performed on 80 laser diodes in total, split into two subgroups operating under quaternary pulse position modulation (QPPM) and nonreturn-to-zero (NRZ) modulation at 16 Mbit/s with a PN-code length of (2 exp 7)-1. Measurements before and upon completion of the aging tests consist of P0/I curves, V/I characteristics, photo diode tracking ratios, spectra, mode hopping behaviors, far-field patterns, wave-front errors and astigmatisms, and linear polarization ratios.

Paper Details

Date Published: 1 June 1991
PDF: 12 pages
Proc. SPIE 1417, Free-Space Laser Communication Technologies III, (1 June 1991); doi: 10.1117/12.43763
Show Author Affiliations
Bodo Menke, ANT Nachrichtentechnik GmbH (Germany)
Roland Loeffler, ANT Nachrichtentechnik GmbH (Germany)

Published in SPIE Proceedings Vol. 1417:
Free-Space Laser Communication Technologies III
David L. Begley; Bernard D. Seery, Editor(s)

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