Share Email Print

Proceedings Paper

The critical role of metrology in nanotechnology
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The nascent nanotechnology revolution promises many benefits to humankind. An exciting and sometimes bewildering variety of new nanofabrication technologies and nanodevices based on electrical, optical, magnetic, mechanical, chemical and biological effects are reported almost daily. It is prudent to ask, however, how many of these breakthroughs will remain laboratory curiosities and how many will proceed to widespread industrialization. We argue that a metrology infrastructure has underpinned all industrial revolutions, and that this infrastructure is weak or nonexistent for many of the proposed nanosystems. More attention needs to be paid to metrology or progress will be derailed in a number of areas.

Paper Details

Date Published: 24 July 2002
PDF: 9 pages
Proc. SPIE 4608, Nanostructure Science, Metrology, and Technology, (24 July 2002); doi: 10.1117/12.437273
Show Author Affiliations

Published in SPIE Proceedings Vol. 4608:
Nanostructure Science, Metrology, and Technology
Martin C. Peckerar; Michael T. Postek, Editor(s)

© SPIE. Terms of Use
Back to Top