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Proceedings Paper

Comparison of the converging and diverging geometries for measuring enhanced backscatter
Author(s): Neil Charles Bruce
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Paper Abstract

In this paper numerical calculations are performed to compare scattered light distributions for light reflected from randomly rough surfaces in the converging and diverging illumination geometries. It is found that the enhanced backscatter peak can be measured accurately if the source and detector are at the same distance in the diverging geometry, and if the source and detector distances are approximately 100 times the size of the illuminated surface.

Paper Details

Date Published: 14 August 2001
PDF: 4 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437240
Show Author Affiliations
Neil Charles Bruce, Univ. Nacional Autonoma de Mexico (Mexico)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

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