Share Email Print
cover

Proceedings Paper

Aspheric metrology with a Shack-Hartmann wavefront sensor
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The basic problem associated with aspheric testing without the use of null optics is to obtain increased measurement range while maintaining the required measurement accuracy. Typically, the introduction of a custom-designed and fabricated null corrector has allowed the problem of aspheric testing to be reduced to that of spherical testing. Shack-Hartmann wavefront sensor have been sued for adaptive optics, but have seen little application in optical metrology. We will discus the use of a Shack-Hartmann wavefront sensor as a means of directly testing wavefronts with large aspheric departures. The Shack-Hartmann sensor provides interesting tradeoffs between measurement range, accuracy and spatial resolution. We will discus the advantages and disadvantages of the Shack-Hartmann wavefront sensor over more conventional metrology tests. The implementation of a Shack-Hartmann wavefront sensor for aspheric testing will be shown.

Paper Details

Date Published: 14 August 2001
PDF: 4 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437221
Show Author Affiliations
John E. Greivenkamp, Optical Sciences Ctr./Univ. of Arizona (United States)
Daniel G. Smith, Optical Sciences Ctr./Univ. of Arizona (United States)
Robert O. Gappinger, Optical Sciences Ctr./Univ. of Arizona (United States)
Gregory A. Williby, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

© SPIE. Terms of Use
Back to Top