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Proceedings Paper

Measurement of fractal characteristics in binary texture distributions
Author(s): Fernando Manzano Licona; Diana Calva Mendez; Mario Garavaglia; Mario Marcelo Lehman
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Paper Abstract

In this work, we superimpose tow and more random images of irregular particles, using different statistics and concentration for the texture distributions. This is achieved using different random generators to obtain binary images in the distribution of these particles. For these case, the box counting dimension is calculated and we obtain the relation between this dimension and the corresponding structure. In this way, we obtain a fractal characterization for the superposition of these binary images.

Paper Details

Date Published: 14 August 2001
PDF: 4 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437185
Show Author Affiliations
Fernando Manzano Licona, Sofilab SACV (Mexico)
Diana Calva Mendez, Sofilab SACV (Mexico)
Mario Garavaglia, Univ. Nacional de La Plata and Ctr. de Investigaciones Opticas (Argentina)
Mario Marcelo Lehman, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

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