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Proceedings Paper

Shearing interferometry to analyze two-dimensional fractal gratings
Author(s): Gustavo Ramirez Zabaleta; Eduardo Tepichin-Rodriguez; Mario Marcelo Lehman; Mario Garavaglia
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Paper Abstract

In this work, the changes in the self-similar functions for a grating under possible structural changes are investigated using the shearing interferometry method. Such changes can be: deformations, introduction of random perturbations or changes in the fractal dimension. The results obtained have applications to relate such changes with the corresponding fractal parameters, which can be extended for the case of rough surfaces.

Paper Details

Date Published: 14 August 2001
PDF: 4 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437122
Show Author Affiliations
Gustavo Ramirez Zabaleta, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Eduardo Tepichin-Rodriguez, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Mario Marcelo Lehman, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Mario Garavaglia, Univ Nacional de La Plata (Argentina)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

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