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Proceedings Paper

Design of an interferogram fringe counter based on LabVIEW
Author(s): R. Rojas-Laguna; E. Vargas-Rodriguez; Daniel Malacara-Doblado; M. Antonio Meneses-Nava; Edgar Alvarado-Mendez; Jose A. Andrade-Lucio; Miguel Torres-Cisneros; J. A. Alvarez-Jaime; Oscar G. Ibarra-Manzano; J. M. Estudillo-Ayala; Baldeamr Ibarra-Escamilla
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Paper Abstract

Most of the optics measurements techniques used generate interferograms as a result. These give us information about the object's quality, surface, etc. Evaluating and knowing the heat gradient of an object, is a typical application of the interferograms analysis. We know that if we subject an object to heat, this will generate interferograms, in which the fringes form will be temporal, the deformation of the fringes tel us the temperature gradient, but it doesn't give us the temperature level of the object. In order to obtain this level we sampled interferograms in different intervals and we count the number of fringes in every sample interferogram. With this process we make a characterization that provide the temperature level change in an object. In order to acquire the interferograms we used the National Instruments IMAQ-1408 board and the software was designed in LabView.

Paper Details

Date Published: 14 August 2001
PDF: 4 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437120
Show Author Affiliations
R. Rojas-Laguna, Univ. de Guanajuato (Mexico)
E. Vargas-Rodriguez, Univ. de Guanajuato (Mexico)
Daniel Malacara-Doblado, Ctr. de Investigaciones en Optica, AC (Mexico)
M. Antonio Meneses-Nava, Ctr. de Investigaciones en Optica, AC (Mexico)
Edgar Alvarado-Mendez, Univ. de Guanajuato (Mexico)
Jose A. Andrade-Lucio, Univ. de Guanajuato (Mexico)
Miguel Torres-Cisneros, Univ. de Guanajuato (Mexico)
J. A. Alvarez-Jaime, Univ. de Guanajuato (Mexico)
Oscar G. Ibarra-Manzano, Univ. de Guanajuato (Mexico)
J. M. Estudillo-Ayala, Univ. de Guanajuato (Mexico)
Baldeamr Ibarra-Escamilla, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

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