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Proceedings Paper

Holographic interferometry techniques using photorefractive crystals of sillenite family Bi12SiO20 (BSO) and their applications in analysis of surfaces
Author(s): M. R. R. Gesualdi; Diogo Soga; Mikiya Muramatsu
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Paper Abstract

The Holographic interferometry is a non-destructive testing of analysis on surfaces in basic research, technological and biomedical fields. However, the holographic interferometry techniques in real-time with conventional materials present serious difficulties. The photorefractives crystal are present as an attractive holographic recording medium. The phenomenon that characterizes these crystals in the photorefractive effect, consists of the refractive index modulation through photo-induced and linear electro-optic effect, allows the register of holograms of phase. Also it presents advantages as in situ self-proceeding of the recording medium and its indefinite reusability, i.e. it does not present fatigue. Thus, the objective of this work is the development of a holographic interferometer that uses the photorefractive crystal of the selenite family Bi12SiO20 as holographic recording medium. In this direction, we search to characterize BSO crystal determining some figures of merit in diffusive regime and drift regime. The holographic techniques of metrology are presented in three methods: real time holographic interferometry, double- exposure holographic interferometry, and time-average holographic interferometry had been studied with some applications in analysis of statics and dynamics processes on surfaces.

Paper Details

Date Published: 14 August 2001
PDF: 5 pages
Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437068
Show Author Affiliations
M. R. R. Gesualdi, Univ. de Sao Paulo (Brazil)
Diogo Soga, Univ. de Sao Paulo (Brazil)
Mikiya Muramatsu, Univ. de Sao Paulo (Brazil)


Published in SPIE Proceedings Vol. 4419:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications

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