Share Email Print
cover

Proceedings Paper

Comparison of field- and laboratory-collected midwave and longwave infrared emissivity spectra/data reduction techniques
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many targets that remote sensing scientists encounter when conducting their research experiments do not lend themselves to laboratory measurement of their surface optical properties. Removal of these targets from the field can change their biotic condition, disturb the surface composition, and change the moisture content of the sample. These parameters, as well as numerous others, have a marked influence on surface optical properties such as spectral and bi-directional emissivity. This necessitates the collection of emissivity spectra in the field. The propagation of numerous devices for the measurement of midwave and longwave emissivity in the field has occurred in recent years. How good are these devices and how does the accuracy of the spectra they produce compare to the tried and true laboratory devices that have been around for decades? A number of temperature/emissivity separation algorithms will be demonstrated on data collected with a field portable Fourier transform infrared (FTIR) spectrometer and the merits and resulting accuracy compared to laboratory spectra made of these identical samples. A brief look at off-nadir view geometries will also be presented to alert scientists to the possible sources of error in these spectra that may result when using sensing systems that do not look straight down on targets or when their nadir looking sensor is looking at a tilted target.

Paper Details

Date Published: 20 August 2001
PDF: 10 pages
Proc. SPIE 4381, Algorithms for Multispectral, Hyperspectral, and Ultraspectral Imagery VII, (20 August 2001); doi: 10.1117/12.437047
Show Author Affiliations
Carl Salvaggio, Spectral Information Technology Applications Ctr. (United States)
Craig J. Miller, Spectral Information Technology Applications Ctr. (United States)


Published in SPIE Proceedings Vol. 4381:
Algorithms for Multispectral, Hyperspectral, and Ultraspectral Imagery VII
Sylvia S. Shen; Michael R. Descour, Editor(s)

© SPIE. Terms of Use
Back to Top