Share Email Print
cover

Proceedings Paper

Remote sensing through reduced Mueller matrix elements
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Measurements of a reduced Mueller matrix in backscattering from diffusive, dielectric targets are reported as a function of the angle of incidence. It was found that the off-diagonal elements depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. A theoretical model that accounts for the non-trivial behavior in the off-diagonal elements of the Mueller matrix is presented. We comment on the applicability of this model to the determination of the shape of the targets.

Paper Details

Date Published: 16 August 2001
PDF: 12 pages
Proc. SPIE 4380, Signal Processing, Sensor Fusion, and Target Recognition X, (16 August 2001); doi: 10.1117/12.436979
Show Author Affiliations
Jeremy D. Ellis, CREOL/Univ. of Central Florida (United States)
Aristide C. Dogariu, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 4380:
Signal Processing, Sensor Fusion, and Target Recognition X
Ivan Kadar, Editor(s)

© SPIE. Terms of Use
Back to Top