Share Email Print

Proceedings Paper

Scatterometry: a metrology for subwavelength surface-relief gratings
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Phase-modulation scatterometry is a metrology technique for determining the parameters of gratings using as a key device a phase modulator. For measurement purposes the phase modulator requires a complicated calibration procedure that is analyzed here in detail. The main source of error to be dealt with are the fluctuations of the phase modulation amplitude. The measurables are the direct term and the first two harmonics of the output. For the fitting of the experimental data we used the ratio of the harmonics to the direct term because it improves significantly the accuracy. A sensitivity analysis was performed for two samples, one real and one theoretical, to find the measurement configuration that insures optimum determination precision for the grating parameters. For the real sample, comparisons of the theoretical predictions for sensitivity with the actual values showed a good agreement. For both samples the sensitivity analysis indicated sub-nanometric precision for the critical dimension (grating linewidth).

Paper Details

Date Published: 22 August 2001
PDF: 12 pages
Proc. SPIE 4344, Metrology, Inspection, and Process Control for Microlithography XV, (22 August 2001); doi: 10.1117/12.436772
Show Author Affiliations
Petre-Catalin Logofatu, CHTM/Univ. of New Mexico (United States)
John R. McNeil, CHTM/Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 4344:
Metrology, Inspection, and Process Control for Microlithography XV
Neal T. Sullivan, Editor(s)

© SPIE. Terms of Use
Back to Top