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Proceedings Paper

Active monitoring and control of electron-beam-induced contamination
Author(s): Andras E. Vladar; Michael T. Postek; Ronald Vane
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Paper Abstract

The vacuum systems of all scanning electron microscopes (SEMs), even in the so-called clean instruments, have certain hydrocarbon residues that the vacuum pumps do not effectively remove. The cleanliness of the vacuum and the amount and nature of these residual molecules depends on the type of the pumps and also on the samples moved through the system. Many times, the vacuum readings are quite good but the electron beam still leaves disturbing contamination marks on the sample. This means that in a critical dimension (CD) SEM, repeated measurements cannot be done without extra, sometimes unacceptably high measurement errors resulting from carry-over. During the time necessary for even one measurement, the sample dimension can change, and the extent of this change remains unknown unless a suitable contamination deposition measurement technique is found and regular monitoring is implemented. This paper assesses the problem of contamination of carbonatious materials in the SEM, shows a possible method for its measurement and presents a promising solution to the contamination deposition problem.

Paper Details

Date Published: 22 August 2001
PDF: 9 pages
Proc. SPIE 4344, Metrology, Inspection, and Process Control for Microlithography XV, (22 August 2001); doi: 10.1117/12.436724
Show Author Affiliations
Andras E. Vladar, National Institute of Standards and Technology (United States)
Michael T. Postek, National Institute of Standards and Technology (United States)
Ronald Vane, XEI Scientific (United States)


Published in SPIE Proceedings Vol. 4344:
Metrology, Inspection, and Process Control for Microlithography XV
Neal T. Sullivan, Editor(s)

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