Share Email Print

Proceedings Paper

Monitoring surface breaking defects in beams with piezoelectric sensors and actuators
Author(s): Sergio Ricardo Kokai Morikawa; Antonio Lopes Gama; Arthur M.B. Braga
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper reports results of the application of a simple technique that explores the use of piezoelectric actuators and sensors to monitor the growth of surface breaking defects in beams. The method consists in exciting the structure with piezoelectric actuators, subjected to either a single frequency or broad-band signal, while recording the electromechanical response of sensors placed close to the defect. Piezoelectric sensors detect the damage growth by monitoring changes in the dynamic strain field induced by the actuator near the defect. The performance of this methodology was assessed through experiments in beams containing surface breaking fatigue cracks or machined slots. Results have shown that the choice of adequate parameters, such as sensor size and its distance to the crack edge, allows the detection of small changes in defect depth. Finite element simulations were also performed to determine a correlation between sensor response, sensor location, and damage size. Results from tests performed in a three-dimensional framed structure are also presented.

Paper Details

Date Published: 16 August 2001
PDF: 10 pages
Proc. SPIE 4327, Smart Structures and Materials 2001: Smart Structures and Integrated Systems, (16 August 2001); doi: 10.1117/12.436541
Show Author Affiliations
Sergio Ricardo Kokai Morikawa, Pontificia Univ. Catolica do Rio de Janeiro (Brazil)
Antonio Lopes Gama, Univ. Federal Fluminense (Brazil)
Arthur M.B. Braga, Pontificia Univ. Catolica do Rio de Janeiro (Brazil)

Published in SPIE Proceedings Vol. 4327:
Smart Structures and Materials 2001: Smart Structures and Integrated Systems
L. Porter Davis, Editor(s)

© SPIE. Terms of Use
Back to Top