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Proceedings Paper

Spectral birefringence characterization of helically wound monomode erbium-doped fibers
Author(s): Diana Tentori; Fernando Trevino-Martinez; Cesar Ayala-Diaz; Francisco J. Mendieta-Jimenez
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Paper Abstract

In this work we apply a simple, non-destructive method we developed for the birefringence characterization of helically wound passive fibers to monomode erbium-doped optical fibers. This method is based on the Jones matrix model developed by JN Ross for helically wound optical fibers. In the case of passive fibers Ross model is correct if the polarization evolution of light is measured with respect o an input local reference frame defined by the helix geometry; but in order to use a fixed reference frame it is necessary to consider the rotation of the plane of polarization introduced by parallel transport along the fiber. The use of Poincare's method and Mueller calculus simplifies the physical interpretation of the results. The birefringence properties of two helically wound erbium fibers are tested in the neighborhood of the amplification band showing that in this case the spectral response has a much stronger variation than in the case of passive step- index monomode fibers. Despite the topological contribution due to the parallel transport of the reference frame, with method where presented provides an easy way to measure the total linear retardation induced by the fiber curvature and the total circular retardation indued by the fiber torsion. Experimental results obtained for two commercial EDF are presented.

Paper Details

Date Published: 30 July 2001
PDF: 10 pages
Proc. SPIE 4532, Active and Passive Optical Components for WDM Communication, (30 July 2001); doi: 10.1117/12.436040
Show Author Affiliations
Diana Tentori, CICESE (Mexico)
Fernando Trevino-Martinez, Univ. Autonoma de Nuevo Leon (Mexico)
Cesar Ayala-Diaz, CICESE (Mexico)
Francisco J. Mendieta-Jimenez, CICESE (United States)

Published in SPIE Proceedings Vol. 4532:
Active and Passive Optical Components for WDM Communication
Achyut Kumar Dutta; Abdul Ahad Sami Awwal; Niloy K. Dutta; Katsunari Okamoto, Editor(s)

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