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Proceedings Paper

Surface scratch and pit analysis on optical interfaces
Author(s): Waqar Mahmood; Murat Ozer; Elena Avram
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Paper Abstract

It is shown that fiber surface performance degradation due to scratches and pits can be analyzed using wave scattering by imperfect surfaces. The return loss of a fiber endface/interface is obtained in terms of a parameter which gives the relative increase in scattering due to a defect over a defectless fiber endface. This parameter can be expressed as the ratio of the bidirectional scatter distribution functions with and without the defect. The predicted return losses as a function of the ratios mentioned above are presented.

Paper Details

Date Published: 30 July 2001
PDF: 7 pages
Proc. SPIE 4532, Active and Passive Optical Components for WDM Communication, (30 July 2001); doi: 10.1117/12.436025
Show Author Affiliations
Waqar Mahmood, CIENA Corp. (United States)
Murat Ozer, CIENA Corp. (United States)
Elena Avram, CIENA Corp. (United States)


Published in SPIE Proceedings Vol. 4532:
Active and Passive Optical Components for WDM Communication
Achyut Kumar Dutta; Abdul Ahad Sami Awwal; Niloy K. Dutta; Katsunari Okamoto, Editor(s)

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