Share Email Print
cover

Proceedings Paper

Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter
Author(s): Irena Fryc
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper the results of measurements of the spectral sensitivity of a silicon detector fitted with a filter for spectral correction are presented. The measurements were made at various angles of incidence of a monochromatic luminous flux on the same surface of the spectral correction filter. The effect of the luminous flux angle of incidence on the spectral sensitivity of the system, detector -- correction filter, was studied. In addition, the errors resulting from changes in spectral sensitivity were determined quantitatively.

Paper Details

Date Published: 10 August 2001
PDF: 4 pages
Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); doi: 10.1117/12.435991
Show Author Affiliations
Irena Fryc, Bialystok Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4517:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light

© SPIE. Terms of Use
Back to Top