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Proceedings Paper

Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter
Author(s): Irena Fryc
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Paper Abstract

In this paper the results of measurements of the spectral sensitivity of a silicon detector fitted with a filter for spectral correction are presented. The measurements were made at various angles of incidence of a monochromatic luminous flux on the same surface of the spectral correction filter. The effect of the luminous flux angle of incidence on the spectral sensitivity of the system, detector -- correction filter, was studied. In addition, the errors resulting from changes in spectral sensitivity were determined quantitatively.

Paper Details

Date Published: 10 August 2001
PDF: 4 pages
Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); doi: 10.1117/12.435991
Show Author Affiliations
Irena Fryc, Bialystok Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4517:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light

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