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Proceedings Paper

Optical constants and film thickness calculation based on the ratio of envelopes of the reflectance spectrum
Author(s): Valery V. Filippov; Vitaly P. Kutavichus
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Paper Abstract

A spectrophotometric method is presented, in which the ratio of envelopes of minima and maxima of reflection spectra is used to determine optical constants of a film on substrate. The ratio used allows avoiding absolute reflectivity measurements. Thus, there is no need for the procedure of a spectrophotometer calibration. An application of the ratio measurements for an analysis of isotropic absorbing homogeneous films is described. Provided the film is transparent, the approach offers the simple analytical solution of an inverse problem. A simple iterative procedure is described to find the thickness and optical constants of absorbing films from measurements for s and p polarizations at single angle of incidence.

Paper Details

Date Published: 10 August 2001
PDF: 8 pages
Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); doi: 10.1117/12.435955
Show Author Affiliations
Valery V. Filippov, B.I. Stepanov Institute of Physics (Belarus)
Vitaly P. Kutavichus, B.I. Stepanov Institute of Physics (Belarus)


Published in SPIE Proceedings Vol. 4517:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light

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