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Proceedings Paper

Quantification and automation of pulsed thermographic NDE
Author(s): Steven M. Shepard; James R. Lhota; Tasdiq Ahmed; Bruce A. Rubadeux; D. Wang
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Paper Abstract

Until recently, thermographic methods for NDE have generally been quantitative, relying heavily on operator interpretation of image data. Although quantitative methods have been developed, they have generally required a priori knowledge of the sample physical properties, or identification of a defect free region within the field of view. Recent advances in pulsed thermography allow reference-free measurement of defect size, sample thickness and material properties without operator intervention or a priori knowledge of sample properties. An essential component of these advances are new signal processing methods based on both the spatial and temporal thermal response of the sample surface temperature to an instantaneous heat pulse. These methods provide a significant reduction in noise and blurring due to lateral diffusion of heat, and effectively increase the maximum penetration depth and spatial resolution beyond that of conventional thermography.

Paper Details

Date Published: 3 August 2001
PDF: 6 pages
Proc. SPIE 4336, Nondestructive Evaluation of Materials and Composites V, (3 August 2001); doi: 10.1117/12.435577
Show Author Affiliations
Steven M. Shepard, Thermal Wave Imaging, Inc. (United States)
James R. Lhota, Thermal Wave Imaging, Inc. (United States)
Tasdiq Ahmed, Thermal Wave Imaging, Inc. (United States)
Bruce A. Rubadeux, Thermal Wave Imaging, Inc. (United States)
D. Wang, Thermal Wave Imaging, Inc. (United States)

Published in SPIE Proceedings Vol. 4336:
Nondestructive Evaluation of Materials and Composites V
George Y. Baaklini; Eric S. Boltz; Steven M. Shepard; Peter J. Shull, Editor(s)

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