Share Email Print
cover

Proceedings Paper

Recent developments on the NRL Modified Betatron Accelerator
Author(s): Jeffry Golden; Lek K. Len; Tab J. Smith; Demos Dialetis; S. J. Marsh; Kevin C. Smith; Joseph Mathew; Peter Loschialpo; Lloyd Seto; Jeng-Hsien Chang; Christos A. Kapetanakos
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

1407_47Since the previously reported successful demonstration of acceleration of electrons to $OM 12 MeV, higher trapped beam current and longer beam lifetime have been obtained. The improved confinement has led to a higher peak energy $OM 18 MeV, and is the result of increasing the strong focusing and toroidal magnetic fields, reducing magnetic field errors, and optimizing the betatron flux condition. Modifications to the electromagnet buswork are in progress to further reduce field errors, and a fast pulsed magnet system to provide dynamic stabilization of the cyclotron resonances is being studied.

Paper Details

Date Published: 1 April 1991
PDF: 12 pages
Proc. SPIE 1407, Intense Microwave and Particle Beams II, (1 April 1991); doi: 10.1117/12.43517
Show Author Affiliations
Jeffry Golden, Berkeley Research Associates, Inc. (United States)
Lek K. Len, F-M Technologies (United States)
Tab J. Smith, Naval Research Lab. (United States)
Demos Dialetis, Science Applications International Corp. (United States)
S. J. Marsh, Sachs-Freeman Associates, Inc. (United States)
Kevin C. Smith, Sachs-Freeman Associates, Inc. (United States)
Joseph Mathew, Naval Research Lab. (United States)
Peter Loschialpo, Naval Research Lab. (United States)
Lloyd Seto, Sachs-Freeman Associates, Inc. (United States)
Jeng-Hsien Chang, Naval Research Lab. (United States)
Christos A. Kapetanakos, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 1407:
Intense Microwave and Particle Beams II
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top