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Proceedings Paper

Broadband absorption spectroscopy by combining frequency-domain and steady-state techniques
Author(s): Andrew J. Berger; Frederic Bevilacqua; Dorota B. Jakubowski; Albert E. Cerussi; John A. Butler; D. Hsiang; Bruce J. Tromberg
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Paper Abstract

A technique for measuring broadband near-infrared absorption spectra of turbid media is presented using a combination of frequency-domain (FD) and steady-state (SS) reflectance methods. Most of the wavelength coverage is provided by a white-light SS measurement, while the FD data are acquired at a few selected wavelengths. Coefficients of absorption ((mu) a) and reduced scattering ((mu) s') derived from the FD data are used to intensity-calibrate the SS measurements and to estimate (mu) s' at all wavelengths in the spectral window of interest. After these steps are performed, (mu) a can be determined by comparing the SS reflectance values to the predictions of diffusion theory, wavelength by wavelength. We present an application of this method to breast tumor characterization. A case study of a fibroadenoma is shown, where different absorption spectra were found between the normal and the tumor sides.

Paper Details

Date Published: 29 June 2001
PDF: 6 pages
Proc. SPIE 4250, Optical Tomography and Spectroscopy of Tissue IV, (29 June 2001); doi: 10.1117/12.434510
Show Author Affiliations
Andrew J. Berger, Beckman Laser Institute and Medical Clinic and The Institute of Optics/Univ. of Rochester (United States)
Frederic Bevilacqua, Beckman Laser Institute and Medical Ctr. (United States)
Dorota B. Jakubowski, Beckman Laser Institute and Medical Ctr. (United States)
Albert E. Cerussi, Beckman Laser Institute and Medical Ctr. (United States)
John A. Butler, Univ. of California/Irvine (United States)
D. Hsiang, Univ. of California/Irvine (United States)
Bruce J. Tromberg, Beckman Laser Institute and Medical Ctr. (United States)

Published in SPIE Proceedings Vol. 4250:
Optical Tomography and Spectroscopy of Tissue IV
Britton Chance; Robert R. Alfano; Bruce J. Tromberg; Mamoru Tamura; Eva Marie Sevick-Muraca, Editor(s)

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