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Proceedings Paper

Model-based testability assessment and directed troubleshooting of shuttle wiring systems
Author(s): Somnath Deb; Chuck Domagala; Roshan Shrestha; Venkatesh Narayana Malepati; Kevin F. Cavanaugh; Ann Patterson-Hine; Dwight Sanderfer; Jim Cockrell
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Paper Abstract

As the space shuttle ages, it is experiencing wiring degradation problems, including arcing, chaffing, insulation breakdown and broken conductors. A systematic and comprehensive test process is required to thoroughly test and QA the wiring systems. The NASA Wiring Integrity Reseach (WIRe) team recognized the value of a formal model based analysis for risk assessment and fault coverage analysis using our TEAMS toolset and commissioned a pilot study with QSI to explore means of automatically extracting high fidelity multisignal models from wiring information databases. The MEC1 Shuttle subsystem was the subject of this study. The connectivity and wiring information for the model was extracted from a Shuttle Connector Analysis Network (SCAN) electronic wirelist. Using this wirelist, QSI concurrently created manual and automatically generated wiring models for all wire paths associated with connector J3 on the MEC1 assembly. The manually generated model helped establish the rules of modeling. The complete MEC1 model was automatically generated based on these rules, thus saving significant modeling cost. The methodology is easily extensible to the entire shuttle wiring system. This paper presents our modeling and analysis results from the pilot study along with our proposed solutions to the complex issues of wiring integrity assessment problem.

Paper Details

Date Published: 20 July 2001
PDF: 11 pages
Proc. SPIE 4389, Component and Systems Diagnostics, Prognosis, and Health Management, (20 July 2001); doi: 10.1117/12.434235
Show Author Affiliations
Somnath Deb, Qualtech Systems, Inc. (United States)
Chuck Domagala, Qualtech Systems, Inc. (United States)
Roshan Shrestha, Qualtech Systems, Inc. (United States)
Venkatesh Narayana Malepati, Qualtech Systems, Inc. (United States)
Kevin F. Cavanaugh, Qualtech Systems, Inc. (United States)
Ann Patterson-Hine, NASA Ames Research Ctr. (United States)
Dwight Sanderfer, NASA Ames Research Ctr. (United States)
Jim Cockrell, NASA Ames Research Ctr. (United States)

Published in SPIE Proceedings Vol. 4389:
Component and Systems Diagnostics, Prognosis, and Health Management
Peter K. Willett; Thiagalingam Kirubarajan, Editor(s)

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