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Proceedings Paper

Nondestructive imaging with mercuric iodide thick film x-ray detectors
Author(s): Michael M. Schieber; Haim Hermon; Asaf Zuck; Alexander I. Vilensky; Leonid Melekhov; Michael Lukach; Evgenie Meerson; Yehezkel Saado; E. Shtekel; Benjamin Reisman; G. Zentai; L. Partain; E. Seppi; Raisa Pavlyuchkova; G. Virshup; Robert A. Street; Steve E. Ready
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Paper Abstract

Polycrystalline mercuric iodide (HgI2) photoconductor material was directly deposited on flat panel amorphous silicon (a-Si) thin film transistor (TFT) pixel arrays in order to test their application as direct x-ray conversion detectors. The 4' x 4' and 2' x 2' detector plates were fabricated either by Physical Vapor Deposition (PVD) or the Screen-Print (SP) method. Although developed for medical radiological imaging, they can also be used for nondestructive test imaging. The present HgI2 arrays have 100 μm x 100 μm pixels on the 2' x 2' detector and 139μm x 139μm on the 4' x 4' imager. The initial results are very promising and show high x-ray sensitivity and low leakage current. The advantage of these detectors is that they can be directly deposited on the pixellated arrays containing the TFTs and other electronic read out circuits and can be fabricated in large sizes. These polycrystalline PVD-HgI2 thick film detectors have now been fabricated up to 1,800μm thick, which makes them also useful for higher-energy X-ray applications. Imaging results obtained by both PVD- and SP-HgI2 will be shown. The effect of the crystallite size on the imaging properties will be demonstrated and the difference in sensitivity applying positive or negative bias on the top electrode will be discussed. Comparison of x-ray sensitivity to other photoconductor materials such a-Se and PbI2 will also be presented.

Paper Details

Date Published: 24 July 2001
PDF: 9 pages
Proc. SPIE 4335, Advanced Nondestructive Evaluation for Structural and Biological Health Monitoring, (24 July 2001); doi: 10.1117/12.434200
Show Author Affiliations
Michael M. Schieber, Hebrew Univ. of Jerusalem and Real Time Radiography Readout (Israel)
Haim Hermon, Real Time Radiography Readout (Israel)
Asaf Zuck, Hebrew Univ. of Jerusalem and Real Time Radiography Readout (Israel)
Alexander I. Vilensky, Real Time Radiography Readout (Israel)
Leonid Melekhov, Real Time Radiography Readout (Israel)
Michael Lukach, Hebrew Univ. of Jerusalem and Real Time Radiography Readout (Israel)
Evgenie Meerson, Real Time Radiography Readout (Israel)
Yehezkel Saado, Hebrew Univ. of Jerusalem and Real Time Radiography Readout (Israel)
E. Shtekel, Real Time Radiography Readout (Israel)
Benjamin Reisman, Real Time Radiography Readout (Israel)
G. Zentai, Ginzton Technology Ctr. (United States)
L. Partain, Ginzton Technology Ctr. (United States)
E. Seppi, Ginzton Technology Ctr. (United States)
Raisa Pavlyuchkova, Ginzton Technology Ctr. (United States)
G. Virshup, Ginzton Technology Ctr. (United States)
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)


Published in SPIE Proceedings Vol. 4335:
Advanced Nondestructive Evaluation for Structural and Biological Health Monitoring
Tribikram Kundu, Editor(s)

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