Share Email Print
cover

Proceedings Paper

Electro-mechanical impedance method for crack detection in metallic plates
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As a nondestructive evaluation technology, the EM impedance method allows us to identify the structural dynamics directly through in-situ active piezoelectric sensors. Previous work performed on 1-D steel beams structures shown through both theoretical analysis and experimental results that E/M impedance (or admittance) spectrum is a direct identifier of structural dynamics. The scope of presented work was to extend the positive results obtained for 1-D structure onto 2-D structures. Experiment analysis of 1-D and2-D structures has shown that E/M impedance (or admittance) spectrum accurately identifies the natural frequency spectrum of the specimens. Theoretical analysis was performed for particular boundary conditions to model the experimental set-up. Experiments were conducted on simple specimens in support of the theoretical investigation, and on thin-gauge aluminum plates to illustrate the method's potential. The number of specimens was sufficient to form a statistical data set. The aging aircraft panel was instrumented with piezoelectric active sensors and the spectrum of natural frequencies was measured at high frequency range. The changing of the spectrum due to presence of local small crack was noticed.

Paper Details

Date Published: 24 July 2001
PDF: 12 pages
Proc. SPIE 4335, Advanced Nondestructive Evaluation for Structural and Biological Health Monitoring, (24 July 2001); doi: 10.1117/12.434167
Show Author Affiliations
Victor Giurgiutiu, Univ. of South Carolina (United States)
Andrei N. Zagrai, Univ. of South Carolina (United States)


Published in SPIE Proceedings Vol. 4335:
Advanced Nondestructive Evaluation for Structural and Biological Health Monitoring
Tribikram Kundu, Editor(s)

© SPIE. Terms of Use
Back to Top