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Proceedings Paper

Graded-index profile analysis from M-line, DNS, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations
Author(s): Stefano Pelli; Giancarlo C. Righini; Marcelo Barbalho Pereira; Flavio Horowitz
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Paper Abstract

Direct near-surface (DNS) and m-line techniques for the measurement of surface refractive index of ion-exchanged waveguides are compared. Measurements are also compared to direct investigation of ion concentration profiles by energy dispersion spectroscopy (EDS). Good agreement is obtained for the Ag+, K+, and Ag++K+ exchanged samples, but not for the K++Ag+ sample. The index profile approximately follows in a linear proportion the concentration profile after a single Ag+-exchange, while this is not observed for all other samples involving K+-exchange. These results on ion-exchange and refractive-index profiles are discussed, towards a comprehensive and accurate characterization of graded-index waveguides.

Paper Details

Date Published: 18 June 2002
PDF: 6 pages
Proc. SPIE 4640, Integrated Optics: Devices, Materials, and Technologies VI, (18 June 2002); doi: 10.1117/12.433249
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Published in SPIE Proceedings Vol. 4640:
Integrated Optics: Devices, Materials, and Technologies VI
Yakov S. Sidorin; Ari Tervonen, Editor(s)

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