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Proceedings Paper

Statistical approaches to scattering
Author(s): Walid Tabbara
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Paper Abstract

Statistical and probabilistic methods have been frequently used to model and analyze electromagnetic scattering problems. This approach may in some cases be the most realistic one, while in others, when combined with deterministic methods, it allows to extract, from the available data, information which are otherwise difficult to obtain. The aim of this presentation is to provide an introduction to some statistically-based approaches of analysis of scattering problems, and illustrate their efficiency and limitations. A general methodology of prediction of the behavior of a complex system can thus be established which, among many advantages, allows a significant reduction of the computational cost.

Paper Details

Date Published: 9 July 2001
PDF: 10 pages
Proc. SPIE 4467, Complex Mediums II: Beyond Linear Isotropic Dielectrics, (9 July 2001); doi: 10.1117/12.432929
Show Author Affiliations
Walid Tabbara, Supelec (France)

Published in SPIE Proceedings Vol. 4467:
Complex Mediums II: Beyond Linear Isotropic Dielectrics
Akhlesh Lakhtakia; Werner S. Weiglhofer; Ian J. Hodgkinson, Editor(s)

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