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Proceedings Paper

Microscopic model for static and dynamic loading of chiral sculptured thin films
Author(s): Akhlesh Lakhtakia
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Paper Abstract

The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.

Paper Details

Date Published: 9 July 2001
PDF: 7 pages
Proc. SPIE 4467, Complex Mediums II: Beyond Linear Isotropic Dielectrics, (9 July 2001); doi: 10.1117/12.432924
Show Author Affiliations
Akhlesh Lakhtakia, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 4467:
Complex Mediums II: Beyond Linear Isotropic Dielectrics
Akhlesh Lakhtakia; Werner S. Weiglhofer; Ian J. Hodgkinson, Editor(s)

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