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Proceedings Paper

Three-dimensional infrared laser vision system for road surface features analysis
Author(s): Liviu Bursanescu; Mihaela Bursanescu; Maher Hamdi; Alain Lardigue; Damien Paiement
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Paper Abstract

A mobile (truck-mounted) imaging system uses laser-based technology to obtain accurate quantitative data in real time and at high speeds regarding the conditions of road and highway surfaces. Specifically, the GIE Technologies laser vision system integrates a three-dimensional laser-sensing imaging sensor array to map the cracks, ruts and roughness of road surfaces. The LaserVision System simultaneously records a three-dimensional information along with photometric data using the same set of Biris (bi-iris) sensors. These sensors were developed for this application by engineers at GIE Technologies Inc. under exclusive license from the National Research Council (Ottawa, Canada). They rely on a combination of defocusing and triangulation principles to record 3D information about a test surface. The Biris approach, for a mobile pavement testing system, offers several performance advantages in comparison to other sensing methods. Most important, a Biris sensor uses all- solid-state components with no moving parts. This rugged design is highly resistant to misalignment and performs well in a moving, continuously vibrating vehicle. The photometric (intensity) information provides complementary data where ranging alone proves insufficient, as when detecting pavement markings, sealed road cracks or patches. In addition, the range analysis uses simple trigonometry to obtain real-time performance.

Paper Details

Date Published: 29 June 2001
PDF: 8 pages
Proc. SPIE 4430, ROMOPTO 2000: Sixth Conference on Optics, (29 June 2001); doi: 10.1117/12.432808
Show Author Affiliations
Liviu Bursanescu, G.I.E. Technologies (Canada)
Mihaela Bursanescu, G.I.E. Technologies (Canada)
Maher Hamdi, G.I.E. Technologies (Canada)
Alain Lardigue, G.I.E. Technologies (Canada)
Damien Paiement, G.I.E. Technologies (Canada)


Published in SPIE Proceedings Vol. 4430:
ROMOPTO 2000: Sixth Conference on Optics

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