Share Email Print

Proceedings Paper

Closed cracks in piezoelectric media subjected to electric field
Author(s): Xianwei Zeng; R. K. Nimal D. Rajapakse
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The conventional traction-free models for insulating and conducting cracks in piezoelectrics predict that an electric field induces zero stress intensity factors at the crack tip. This fails to explain the experimentally observed growth of both insulating and conducting cracks under electric field. To remove the discrepancy between theory and experiments, electric field induced crack closure is considered in this study. Conditions for crack closure are derived by using the solutions for traction-free models. Mixed boundary value problems for closed cracks (insulating and conducting) are formulated using the extended Lekhnitskii's formalism for piezoelectric solids. Analytical solutions are derived for both cases of closed cracks. The present solution predicts that electric loading can induce non-zero (positive) mode-I stress intensity factor at an insulating or conducting crack. The intensified tensile stress directly ahead of the tip of a closed crack can give rise to crack growth. This offers a possible explanation for the experimental observations. Additionally, the effect of polarization switching on the crack tip behavior of both insulating and conducting closed cracks is investigated. Numerical studies show that polarization switching may enhance or decrease the intensity of tensile stress ahead of a closed crack.

Paper Details

Date Published: 11 July 2001
PDF: 9 pages
Proc. SPIE 4333, Smart Structures and Materials 2001: Active Materials: Behavior and Mechanics, (11 July 2001); doi: 10.1117/12.432761
Show Author Affiliations
Xianwei Zeng, Univ. of British Columbia (Canada)
R. K. Nimal D. Rajapakse, Univ. of British Columbia (Canada)

Published in SPIE Proceedings Vol. 4333:
Smart Structures and Materials 2001: Active Materials: Behavior and Mechanics
Christopher S. Lynch, Editor(s)

© SPIE. Terms of Use
Back to Top