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Proceedings Paper

Temperature-dependent operation of GaInAsP/InP VCSELs
Author(s): Carl J. Hepburn; Russell Sceats; Adrian Boland-Thoms; Naci Balkan; A. J. Dann; Simon D. Perrin; Ian Read; J. Reed; P. Cannard; Michael A. Fisher; D. J. Elton; M. Harlow
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Paper Abstract

We present the results of our studies concerning the pulsed operation of a bulk GaInAsP/InP vertical cavity surface emitting laser (VCSEL). The device is tailored to emit at around 1.5 micrometers at room temperature. The structure has a 45-period n-doped GaInAsP/InP bottom Distributed Bragg Reflector (DBR), and a 4 period Si/Al2O3 dielectric top reflector defining a 3-(lambda) cavity. Electroluminescence from a 16micrometers diameter top window was measured in the pulsed injection mode. Spectral measurements were recorded in the temperature range between 125K and 240K. Lasing threshold current density has a broad minimum at temperatures between 170K-190K. In order to establish the relationship between the temperature dependence of the threshold current and the gain peak, we investigated the spectral dependence of edge and surface emission from optically pumped structures without the top reflector. Experimental result are compared with existing theories concerning the temperature dependence of threshold current.

Paper Details

Date Published: 9 July 2001
PDF: 9 pages
Proc. SPIE 4283, Physics and Simulation of Optoelectronic Devices IX, (9 July 2001); doi: 10.1117/12.432618
Show Author Affiliations
Carl J. Hepburn, Univ. of Essex (United Kingdom)
Russell Sceats, Univ. of Essex (United Kingdom)
Adrian Boland-Thoms, Univ. of Essex (United Kingdom)
Naci Balkan, Univ. of Essex (United Kingdom)
A. J. Dann, BT Labs. (United Kingdom)
Simon D. Perrin, BT Labs. (United Kingdom)
Ian Read, BT Labs. (United Kingdom)
J. Reed, BT Labs. (United Kingdom)
P. Cannard, BT Labs. (United Kingdom)
Michael A. Fisher, BT Labs. (United Kingdom)
D. J. Elton, BT Labs. (United Kingdom)
M. Harlow, BT Labs. (United Kingdom)


Published in SPIE Proceedings Vol. 4283:
Physics and Simulation of Optoelectronic Devices IX
Yasuhiko Arakawa; Peter Blood; Marek Osinski, Editor(s)

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