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Proceedings Paper

Semiconductor lasers stabilized to spectral holes in rare-earth crystals
Author(s): Rufus L. Cone; Thomas Boettger; G. J. Pryde; N. M. Strickland; Yongchen Sun; Peter B. Sellin; John L. Carlsten
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Paper Abstract

Single-frequency diode lasers have been frequency stabilized to 200 Hz at 1.5 microns and to 20 Hz at 793 nm with 10-100 ms integration times using narrow spectral holes in the absorption lines of Er3+ and Tm3+ doped cryogenic crystals. The narrow spectral holes are used as frequency references, and this laser performance was obtained without requiring vibrational isolation of either the laser or frequency reference. Kilohertz frequency stability for 100 s integration times is provided by these techniques, and that performance should be improved to the Hertz level and should be extended to longer integration times with further development. Miniaturized external cavity diode lasers and 5 mm-sized reference crystals will provide compact portable packages with a closed cycle cryocooler. The achieved frequency stabilization provides lasers that are ideal for interferometry, high-resolution spectroscopy such as photon echoes, real time optical signal processing based on spectral holography, and other applications requiring ultranarrow-band light sources or coherent detection.

Paper Details

Date Published: 9 July 2001
PDF: 12 pages
Proc. SPIE 4283, Physics and Simulation of Optoelectronic Devices IX, (9 July 2001); doi: 10.1117/12.432583
Show Author Affiliations
Rufus L. Cone, Montana State Univ./Bozeman (United States)
Thomas Boettger, Montana State Univ./Bozeman (United States)
G. J. Pryde, Montana State Univ./Bozeman (United States)
N. M. Strickland, Montana State Univ./Bozeman (United States)
Yongchen Sun, Montana State Univ./Bozeman (United States)
Peter B. Sellin, Montana State Univ./Bozeman (United States)
John L. Carlsten, Montana State Univ./Bozeman (United States)

Published in SPIE Proceedings Vol. 4283:
Physics and Simulation of Optoelectronic Devices IX
Yasuhiko Arakawa; Peter Blood; Marek Osinski, Editor(s)

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