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Proceedings Paper

Interferometric figure metrology: enabling in-house traceability
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Paper Abstract

The basic goal of the Advanced Optics Metrology program in NIST's Manufacturing Engineering Laboratory is to help industry ensure that their measurement results of optical figure and wavefront are traceable. This paper underscores the importance of traceability and reviews the facilities and projects dedicated to achieving that objective.

Paper Details

Date Published: 18 June 2001
PDF: 13 pages
Proc. SPIE 4450, Harnessing Light: Optical Science and Metrology at NIST, (18 June 2001); doi: 10.1117/12.431256
Show Author Affiliations
Christopher J. Evans, National Institute of Standards and Technology (United States)
Angela D. Davies, National Institute of Standards and Technology (United States)
Tony L. Schmitz, National Institute of Standards and Technology (United States)
Robert E. Parks, Optical Perspectives Group (United States)


Published in SPIE Proceedings Vol. 4450:
Harnessing Light: Optical Science and Metrology at NIST
Carmina Londono, Editor(s)

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