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Proceedings Paper

Electronic display metrology: not a simple matter
Author(s): Edward F. Kelley
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Paper Abstract

Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye sees can be very difficult to capture accurately and quickly in a meaningful way. With the advent of many new display technologies, there is a need to a level playing field so that different technologies can be compared on an equivalent basis. Orchestrating display metrology to accomplish this is wrought with several difficulties that will be reviewed especially in the areas of stray light management/measurement and meaningful reflection characterization.

Paper Details

Date Published: 18 June 2001
PDF: 10 pages
Proc. SPIE 4450, Harnessing Light: Optical Science and Metrology at NIST, (18 June 2001); doi: 10.1117/12.431252
Show Author Affiliations
Edward F. Kelley, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 4450:
Harnessing Light: Optical Science and Metrology at NIST
Carmina Londono, Editor(s)

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