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Proceedings Paper

Experimental evaluation of a novel CdZnTe flat-panel x-ray detector for digital radiography and fluoroscopy
Author(s): Satoshi Tokuda; Susumu Adachi; Toshiyuki Sato; Toshinori Yoshimuta; Hisashi Nagata; Kazuhiro Uehara; Yoshihiro Izumi; Osamu Teranuma; Satoshi Yamada
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Paper Abstract

We made a prototype flat-panel X-ray detector with a polycrystalline CdZnTe film, and evaluated its imaging performance with respect to leakage current, X-ray sensitivity, MTF, DQE and image lag. The detector incorporates a novel hybrid technique in which zinc-doped CdTe is pre-deposited onto a ceramic substrate and then connected to a TFT circuit substrate. We carefully selected the material for the sensor substrate in order to avoid both incident x-ray attenuation in the substrate and micro-cracks in CdZnTe film. The film thickness was approximately 300 micrometers . The imaging area is composed of 512 X 384 pixels, with a pixel pitch of 150 micrometers .

Paper Details

Date Published: 28 June 2001
PDF: 8 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430924
Show Author Affiliations
Satoshi Tokuda, Shimadzu Corp. (Japan)
Susumu Adachi, Shimadzu Corp. (Japan)
Toshiyuki Sato, Shimadzu Corp. (Japan)
Toshinori Yoshimuta, Shimadzu Corp. (Japan)
Hisashi Nagata, Sharp Corp. (Japan)
Kazuhiro Uehara, Sharp Corp. (Japan)
Yoshihiro Izumi, Sharp Corp. (Japan)
Osamu Teranuma, Sharp Corp. (Japan)
Satoshi Yamada, Shimadzu Corp. (Japan)


Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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